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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hahn, Y. Thoma, C. Bhattacharjee, K. Henderson, D. Garber, E. |
| Copyright Year | 1994 |
| Abstract | Design of SPUDT type SAW devices requires accurate values or velocity shifts and reflection coefficients associated with asymmetric finger overlays in each unit cell. Until now, these parameters have been deduced experimentally since accurate theoretical models are not available. Previous work has been limited to symmetric and periodic structures. We report extension of the model to analyses of EWC and DART. The first-order reflection coefficients $r_{1}$ and velocity shift $s_{1}$ are computed for several standard SAW materials and cuts. The sensitivity of r and s to variations in the finger geometry is determined for the SPUDT structure. Comparison between theoretical and experimental results for 34°-quartz and 112° $LiTaO_{3}$ are presented. The second order effects of evanescent and bulk waves of higher harmonics coupled to the fundamental components are expected to be important for thicker fingers |
| Starting Page | 233 |
| Ending Page | 236 |
| File Size | 327793 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780320123 |
| DOI | 10.1109/ULTSYM.1994.401585 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1994-10-31 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Acoustic velocity measurement Acoustic reflection Surface acoustic wave transducers Quartz materials/devices Lithium materials/devices |
| Content Type | Text |
| Resource Type | Article |
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