NDLI: Preparation of textured LiNbO/sub 3/ thin films by off-axis laser deposition and their characterization

Content Provider	IEEE Xplore Digital Library
Author	Kaemmer, K. Franke, K. Holzapfel, B. Stephan, D. Weihnacht, M.
Copyright Year	1996
Description	Author affiliation: Inst. for Solid State & Mater. Res., Dresden, Germany (Kaemmer, K.)
Abstract	We report on the preparation of lithium niobate thin films on (01.2) and (0001) sapphire and LaAlO/sub 3/ (01.2) single crystalline substrates using off-axis laser deposition. X-ray diffraction in Bragg-Brentano geometry and in a microdiffractometer with an area detector were used to characterize the crystallography, the texture and the lateral homogeneity of the films. We examined the film morphology with atomic force microscopy (AFM) and scanning electron microscopy (SEM). For the preparation of thin films, the deposition temperature, the deposition pressure and the oxygen-Ar ratio of background pressure were varied. The films grow textured and oriented on the substrates used. For thin films on LaAlO/sub 3/ substrates we found only (01.2) reflections of film and substrate in the Bragg-Brentano diffractometer with its selective reflection recording. This suggests that the films are oriented grown and consist of a single LiNbO/sub 3/ phase. Investigations with the microdiffractometer showed that there is also an amount of a LiNb/sub 3/O/sub 8/ textured phase in the films. Thin films deposited on sapphire substrates consist of different mixtures of the LiNbO/sub 3/ phase and the LiNb/sub 3/O/sub 8/ phase depending on the oxygen-Ar ratio of ambient atmosphere. At an oxygen-Ar ratio of 1:4, the films consist mainly of oriented LiNbO/sub 3/. The dielectric polarization and domain structure of the films were investigated by electric scanning force microscopy.
Starting Page	243
Ending Page	246
File Size	285307
Page Count	4
File Format	PDF
ISBN	0780336151
ISSN	10510117
DOI	10.1109/ULTSYM.1996.583967
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1996-11-03
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Substrates Atomic force microscopy Scanning electron microscopy Sputtering Optical films Optical reflection Lithium niobate Crystallization X-ray lasers X-ray diffraction
Content Type	Text
Resource Type	Article

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