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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Tamm, C.R. |
| Copyright Year | 2000 |
| Description | Author affiliation: Cyto, Meridian, Inc (Tamm, C.R.) |
| Abstract | This report focuses on the reliability of electrical terminations. We explore the factors which comprise high integrity connections, and those which contribute to failures thereof. We conduct a complete review of the dynamics of electrical connections and analysis of the new technology of "spring compression" in larger cable connectors. Electrical equipment failures are all predominantly traced back to connector or termination failures. These are due in part to poor workmanship resulting in perhaps improper installation, improper use of installation tools, and simply failures of aging connections. Much research has been done to identify these various causes of failure within the termination itself. Integrity and stability of the interface between the conductor, the connector, and the termination point may be affected by many factors. Among these are; differing coefficients of linear expansion, oxidation of the materials, electrochemical reactivity or corrosion, creep or material cold flow, the effects of vibration and magnetostriction, and thermal aging due to heat cycling. These characteristics indicate that in the microscopic world of the electrical interface of a connector, we are dealing with a dynamic rather than a static issue. Research has indicated that elasticity in the immediate area of the electrical interface can be designed to compensate for these adverse effects. |
| Starting Page | 129 |
| Ending Page | 134 |
| File Size | 544117 |
| Page Count | 6 |
| File Format | |
| ISBN | 0780366255 |
| DOI | 10.1109/TDCLLM.2000.882810 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2000-10-08 |
| Publisher Place | Canada |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Connectors Magnetic materials Conducting materials Aging Equipment failure Stability Oxidation Corrosion Creep Magnetostriction |
| Content Type | Text |
| Resource Type | Article |
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