NDLI: A multiscale stochastic modeling approach to the monitoring of mechanical systems

Content Provider	IEEE Xplore Digital Library
Author	Chou, K.C. Heck, L.P.
Copyright Year	1994
Description	Author affiliation: Appl. Control & Signal Process. Group, SRI Int., Menlo Park, CA, USA (Chou, K.C.; Heck, L.P.)
Abstract	Presents results on using a statistical model motivated by the wavelet transform to represent non-stationary signals typically encountered in machinery monitoring applications. The authors propose the use of a frame-based system in which the data in each frame is modeled as a multiscale stochastic process. The parameters of a multiscale model are used as features for each frame, where each frame of features is modeled as a sample of a multivariate, multimodal distribution. Classification of machine states based on monitoring signals is performed by comparing likelihood scores for each machine state. The authors present an example of applying the system to data consisting of a superposition of damped sinusoids, as a way of illustrating system performance for the case of transient monitoring signals. They compare their system to one which is trained using a DFT-based (non-time-frequency-based) representation (in particular, LPC coefficients) and show that their system exhibits both superior performance as well as greater robustness to noise in the signals. They also compare results using multiscale parameters versus LPC coefficients for the case of synthesized autoregressive signals and for the case of actual, measured signals from a weld depth monitoring system.
Starting Page	25
Ending Page	27
File Size	283519
Page Count	3
File Format	PDF
ISBN	0780321278
DOI	10.1109/TFSA.1994.467371
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-10-25
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Stochastic systems Mechanical systems Condition monitoring Linear predictive coding Machinery Time frequency analysis Binary trees Process control Signal processing Wavelet transforms
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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