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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Sayeed, A.M. Jones, D.L. |
| Copyright Year | 1996 |
| Description | Author affiliation: Coordinated Sci. Lab., Illinois Univ., Urbana, IL, USA (Sayeed, A.M.) |
| Abstract | Optimal detectors based on time-frequency/time-scale representations (TFRs/TSRs) admit a representation in terms of a bank of spectrograms/scalograms that yields a large class of detectors. These range from the conventional matched filter to the more complex higher-rank detectors offering a superior performance in a wider variety of detection situations. In this paper, we optimize this complexity versus performance tradeoff by characterizing TFR/TSR detectors that optimize performance (based on the deflection criterion) for any given fixed rank. We also characterize the gain in performance as a function of increasing complexity thereby facilitating a judicious tradeoff. Our experience with real data shows that, in many cases, relatively low-rank optimal detectors can provide most of the gain in performance relative to matched-filter processors. |
| Starting Page | 209 |
| Ending Page | 212 |
| File Size | 491515 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780335120 |
| DOI | 10.1109/TFSA.1996.547218 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1996-06-18 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Time frequency analysis Detectors Kernel Eigenvalues and eigenfunctions Testing Statistical analysis Parameter estimation Spectrogram Phase detection Noise measurement |
| Content Type | Text |
| Resource Type | Article |
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