NDLI: Reliability of solid-state lighting electrical drivers subjected to WHTOL accelerated aging

Content Provider	IEEE Xplore Digital Library
Author	Lall, P. Sakalaukus, P. Davis, L.
Copyright Year	2014
Description	Author affiliation: RTI Int., Research Triangle Park, NC, USA (Davis, L.) \|\| NSF-CAVE3 Electron. Res. Center, Auburn Univ., Auburn, AL, USA (Lall, P.; Sakalaukus, P.)
Abstract	An investigation of a solid-state lighting (SSL) luminaire with the focus on the electronic driver which has been exposed to a standard wet hot temperature operating life (WHTOL) of 85% RH and 85°C in order to assess reliability of prolonged exposer to a harsh environment has been conducted. SSL luminaires are beginning introduced as headlamps in some of today's luxury automobiles and may also be fulfilling a variety of important outdoor applications such as overhead street lamps, traffic signals and landscape lighting. SSL luminaires in these environments are almost certain to encounter excessive moisture from humidity and high temperatures for a persistent period of time. The lack of accelerated test methods for LEDs to assess long-term reliability prior to introduction into the marketplace, a need for SSL physics based PHM modeling indicators for assessment and prediction of LED life, as well as the U.S. Department of Energy's R&D roadmap to replace todays lighting with SSL luminaires makes it important to increase the understanding of the reliability of SSL devices, specifically, in harsh environment applications. In this work, a set of SSL electrical drivers were investigated to determine failure mechanisms that occur during prolonged harsh environment applications. Each driver consists of four aluminum electrolytic capacitors (AECs) of three different types and was considered the weakest component inside the SSL electrical driver. The reliability of the electrical driver was assessed by monitoring the change in capacitance and the change in equivalent series resistance for each AEC, as well as monitoring the luminous flux of the SSL luminaire or the output of the electrical driver. The luminous flux of a pristine SSL electrical driver was also monitored in order to detect minute changes in the electrical drivers output and to aid in the investigation of the SSL luminaires reliability. The failure mechanisms of the electrical drivers have been determined and are presented in this paper.
Starting Page	1164
Ending Page	1170
File Size	4773232
Page Count	7
File Format	PDF
ISBN	9781479952670
ISSN	10879870
DOI	10.1109/ITHERM.2014.6892411
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-05-27
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Reliability Light emitting diodes Abstracts Capacitors Solid modeling Driver circuits LED Electrolytic Capacitor Solid-State Lighting
Content Type	Text
Resource Type	Article

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