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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Wyland, C.P. |
| Copyright Year | 1992 |
| Description | Author affiliation: Integrated Device Techol. Inc., Santa Clara, CA, USA (Wyland, C.P.) |
| Abstract | The thermal characteristics of three 160 pin commercial quad flatpacks were examined. The packages were modeled and tested in accordance with MIL STD 883C-Method 1012.1 and SEMI Standards G38-87, G42-88, G43-87. The purpose of the comparison was to find the coolest commercial class package currently available for high-power RISC devices. The author addresses the relation of theta jc as a poor predictor of theta ja for the thermal enhancements presented and introduces a possible heuristic for modeling semiconductor component packaging. Use of the heuristic is shown to be generally accurate within 5% of the measured values using the data presented. The all-aluminum quad flatpack appears to have the best thermal characteristics of the packages compared. Although it has a theta jc comparable to that of the thermally enhanced plastic quad flatpack, it has better theta ja numbers from still air to high-speed air flow. For low-power applications the normal plastic quad flatpack seems to be an acceptable package, but when the power dissipation exceeds 2 W or more, the thermally enhanced packages must be used. |
| Starting Page | 257 |
| Ending Page | 261 |
| File Size | 294725 |
| Page Count | 5 |
| File Format | |
| ISBN | 0780305035 |
| DOI | 10.1109/ITHERM.1992.187771 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1992-02-05 |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Testing Semiconductor device packaging Copper Temperature sensors Electrical resistance measurement Reduced instruction set computing Printed circuits Plastic packaging Aluminum Thermal resistance |
| Content Type | Text |
| Resource Type | Article |
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