NDLI: Test time reduction with SATOM: Simultaneous AC-DC Test with Orthogonal Multi-excitations

Content Provider	IEEE Xplore Digital Library
Author	Degang Chen Zhongjun Yu Maniar, K. Nowrozi, M.
Copyright Year	2013
Description	Author affiliation: Texas Instrum., Tucson, AZ, USA (Maniar, K.; Nowrozi, M.) \|\| Iowa State Univ., Ames, IA, USA (Degang Chen; Zhongjun Yu)
Abstract	Test time controls the competitiveness and viability of new precision products in two fundamental ways: it determines final test cost which is a major part of the recurring manufacturing cost, and it determines characterization test time which directly adds to time to market. This paper introduces a new test strategy aimed at dramatically reducing test time for precision analog and mixed signal products. The strategy is termed SATOM for Simultaneous AC-DC Test with Orthogonal Multi-excitations. In SATOM, a device under test is excited with multiple mutually-orthogonal stimulus signals that are simultaneously applied at different input points of the device. A single set of response data is acquired and an intelligent processing algorithm is used to simultaneously compute multiple AC and DC test specifications for the device. This results in a reduction of well over 90% in test time for those specs, with no negative impact on test coverage and test accuracy. Extensive measurement results demonstrated effectiveness, efficiency and robustness of the new method.
Starting Page	1
Ending Page	9
File Size	391492
Page Count	9
File Format	PDF
ISBN	9781479908592
ISSN	10893539
DOI	10.1109/TEST.2013.6651912
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-09-06
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Linearity Testing Noise Time-domain analysis Accuracy Harmonic distortion Production
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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