NDLI: Test cost reduction through performance prediction using virtual probe

Content Provider	IEEE Xplore Digital Library
Author	Hsiu-Ming Chang Kwang-Ting Cheng Wangyang Zhang Xin Li Butler, K.M.
Copyright Year	2011
Description	Author affiliation: Carnegie Mellon Univ., Pittsburgh, PA, USA (Wangyang Zhang; Xin Li) \|\| Univ. of California, Santa Barbara, CA, USA (Hsiu-Ming Chang; Kwang-Ting Cheng) \|\| Texas Instrum., Dallas, TX, USA (Butler, K.M.)
Abstract	The virtual probe (VP) technique, based on recent breakthroughs in compressed sensing, has demonstrated its ability for accurate prediction of spatial variations from a small set of measurement data. In this paper, we explore its application to cost reduction of production testing. For a number of test items, the measurement data from a small subset of chips can be used to accurately predict the performance of other chips on the same wafer without explicit measurement. Depending on their statistical characteristics, test items can be classified into three categories: highly predictable, predictable, and un-predictable. A case study of an industrial RF radio transceiver with more than 50 production test items shows that a good fraction of these test items (39 out of 51 items) are predictable or highly predictable. In this example, the 3σ error of VP prediction is less than 12% for predictable or highly predictable test items. Applying the VP technique can on average replace 59% of test measurement by prediction and, consequently, reduce the overall test time by 57.6%.
Sponsorship	IEEE Comput. Soc.
Starting Page	1
Ending Page	9
File Size	525241
Page Count	9
File Format	PDF
ISBN	9781457701535
ISSN	10893539
e-ISBN	9781457701528
DOI	10.1109/TEST.2011.6139129
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-09-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Semiconductor device measurement Accuracy Correlation Radio frequency Production Probes
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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