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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Jae-Seung Ryu Jong-Hwan Oh Jeong-Goo Kim Tak-Mo Koo Kil-Houm Park |
| Copyright Year | 2004 |
| Description | Author affiliation: Sch. of Electr. Eng. & Comput. Sci., Kyungpook Nat. Univ., Daegu, South Korea (Jae-Seung Ryu; Jong-Hwan Oh) |
| Abstract | In this paper, we propose a Mura detection method in LCM panel using wavelet transform. Generally, the defect in LCM is so burred that the Mura boundary between defect and background is not clear. To detect and recognize exactly the boundary part of the defect, discrete wavelet transform is used. Then considering the relationship of wavelet coefficients, the significant and insignificant coefficients are separated. After the OR logical operation, closing morphological operation are performed to detect the Mura defect. By the experiment, the proposed method shows promising results for Mura detection in LCM panels. |
| Sponsorship | IEEE Region 10 |
| Starting Page | 219 |
| Ending Page | 222 |
| File Size | 1937171 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780385608 |
| DOI | 10.1109/TENCON.2004.1414396 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-11-24 |
| Publisher Place | Thailand |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Inspection Wavelet coefficients Liquid crystal displays Discrete wavelet transforms Humans Flat panel displays Wavelet transforms Thin film transistors Liquid crystal devices Production |
| Content Type | Text |
| Resource Type | Article |
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