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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Billingsley, R. Cook, I. |
| Copyright Year | 1986 |
| Description | Author affiliation: Research Laboratory, TYCOR ELECTRONIC PRODUCTS LTD. Calgary, Alberta Canada (Billingsley, R.; Cook, I.) |
| Abstract | It is the objective of this paper to determine the levels at which Normal and Common Mode AC powerline disturbances affect the operation and integrity of microprocessor based equipment. These disturbances impact on system operation in varying degrees, from disruption of logic to actual degradation and component failure. The results summarized in this paper are based on observations of the DC output voltage variation of typical power supplies when subjected to surge testing based on ANSI/IEEE C62.41-1980 Voltage Waveforms. It can be concluded from these observations that AC powerline transients in the range of magnitude of 100 volts peak or greater, have a significant effect on the DC output voltages of typical power supplies. It was also determined that transients in the Normal Mode were more disruptive to DC power supply operation than those in the Common Modes. |
| Starting Page | 563 |
| Ending Page | 569 |
| File Size | 5346127 |
| Page Count | 7 |
| File Format | |
| ISBN | 096923161X |
| DOI | 10.1109/INTLEC.1986.4794483 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1986-10-19 |
| Publisher Place | Canada |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Microprocessors Surge protection Electronic equipment testing Power system transients Power supplies Electronic equipment Circuits Voltage control Laboratories Power system reliability |
| Content Type | Text |
| Resource Type | Article |
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