NDLI: A new hierarchical built-in self-test with on-chip diagnosis for VLIW processors

Content Provider	IEEE Xplore Digital Library
Author	Ulbricht, M. Scholzel, M. Koal, T. Vierhaus, H.T.
Copyright Year	2011
Description	Author affiliation: Computer Engineering Group, Brandenburg University of Technology, Cottbus, Germany (Ulbricht, M.; Scholzel, M.; Koal, T.; Vierhaus, H.T.)
Abstract	This paper presents a new in-the-field self-test approach for a specific VLIW processor model with emphasis on the diagnostic capability of the test. It is intended to be used as start-up test in-the-field in order to localize permanently defect components in a VLIW processor model, which provides self-repair capability. In order to overcome the drawbacks of several existing self-test techniques, a combination of them in a hierarchical manner is provided. By this, the data path of the VLIW processor can be checked within a very short time and at a fine grained diagnostic level. The results show that the required diagnostic resolution for the used processor model with self-repair capability can be obtained with a relatively small hardware overhead of about 6%.
Starting Page	143
Ending Page	146
File Size	693000
Page Count	4
File Format	PDF
ISBN	9781424497553
e-ISBN	9781424497560
DOI	10.1109/DDECS.2011.5783067
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-04-13
Publisher Place	Germany
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Program processors Registers VLIW Hardware Circuit faults System-on-a-chip In-The-Field Diagnostic Self-Test SBST
Content Type	Text
Resource Type	Article

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