NDLI: Effect of perturbations in the geometry on the electroencephalography inverse problem

Content Provider	IEEE Xplore Digital Library
Author	von Ellenrieder, N. Muravchik, C.H. Nehorai, A.
Copyright Year	2003
Description	Author affiliation: Fac. de Ingenieria, Univ. Nacional de La Plata, Argentina (von Ellenrieder, N.; Muravchik, C.H.)
Abstract	We study the effect of perturbations in the geometry of the head model on the accuracy of electroencephalography (EEG) source parameter estimation. These perturbations are small changes in the surfaces between layers of different electric conductivities used to model the head. We use a meshless method to solve the EEG forward problem. The method needs only a set of points on the surfaces to describe the model geometry. It allows a simple computation of the sensitivity of the estimation problem to the positions of these surface points. The effect of the perturbations on the measured electric potential is analyzed by means of the Cramer-Rao bound for the source parameter estimation.
Sponsorship	IEEE Signal Processing Soc
Starting Page	286
Ending Page	289
File Size	345387
Page Count	4
File Format	PDF
ISBN	0780379977
DOI	10.1109/SSP.2003.1289400
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-09-28
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Geometry Electroencephalography Inverse problems Brain modeling Magnetic heads Electric potential Computer interfaces Solid modeling Parameter estimation Electric variables measurement
Content Type	Text
Resource Type	Article

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