NDLI: A simulation study of a miniature parallel ECT sensor

Content Provider	IEEE Xplore Digital Library
Author	Zhen Ren Wuqiang Yang
Copyright Year	2014
Description	Author affiliation: Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK (Zhen Ren; Wuqiang Yang)
Abstract	Electrical capacitance tomography (ECT) has been developed successfully for industrial applications. While most ECT sensors employ a circular structure with a closed sensing area, some other structures like square and parallel are needed for some particular applications. This paper describes a parallel structure ECT sensor, which can provide incomplete measurement data only. The performance of this parallel ECT sensor is discussed based on simulation study with 2D FEM models. Images of different permittivity distributions are generated by linear back-projection (LBP) and Landweber iteration algorithms. The effect of the effective sensing area and distance of parallel plates are also discussed. Both capacitance residual and correlation coefficient are used to evaluate the image quality. The results show that (1) the width of the sensing area should be the same as the shielding layer in order to acquire high quality image and (2) the distance between two parallel plates is suggested being equal to the shielding layer to compromise the sensing space and the sensitivity of the central region.
Starting Page	144
Ending Page	147
File Size	1251191
Page Count	4
File Format	PDF
ISBN	9781479952205
DOI	10.1109/IST.2014.6958462
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-10-14
Publisher Place	Greece
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Sensors Sensitivity Capacitance Electrodes Correlation coefficient Image reconstruction Finite element analysis incomplete measurement ECT parallel sensor
Content Type	Text
Resource Type	Article

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