NDLI: Effective image and spectral data acquisition method used in scanning near-field optical microscopy by bimorph-based shear force sensor

Content Provider	IEEE Xplore Digital Library
Author	Wei Cai Mu Yang Yingjie Wang Guangyi Shang
Copyright Year	2013
Description	Author affiliation: Dept. of Appl. Phys., Beihang Univ., Beijing, China (Wei Cai; Mu Yang; Yingjie Wang; Guangyi Shang)
Abstract	We have introduced a home-made scanning near-field optical microscope (SNOM) with bimorph-based shear force sensor. The instrumentation of the imaging system and the key techniques such as the bimorph-based non-optical shear force sensor design and the fabrication of optical fiber probes used in this SNOM are described in details. Then the good performance of the system is demonstrated by various experiments such as shear force imaging, near-field optical imaging, surface plasmon resonance detection, and near-field spectroscopy. The imaging and spectroscopic experimental results suggest that this home-made SNOM and bimorph-based shear force detection method would be promising techniques to be used in a variety of nanomaterials research and their optical applications.
Sponsorship	IEEE Instrum. Meas. Soc.
Starting Page	155
Ending Page	159
File Size	549123
Page Count	5
File Format	PDF
e-ISBN	9781467357913
DOI	10.1109/IST.2013.6729682
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-10-22
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Optical imaging Optical fibers Optical fiber sensors Microscopy Optical films near-field spectroscopy scanning near-field optical microscopy shear force microscopy bimorph shear force sensor
Content Type	Text
Resource Type	Article

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