NDLI: Boundary reconstruction of completely conductive inclusions by Electrical resistance tomography

Content Provider	IEEE Xplore Digital Library
Author	Chao Tan Yaoyuan Xu Feng Dong
Copyright Year	2011
Description	Author affiliation: Sch. of Electr. Eng. & Autom., Tianjin Univ., Tianjin, China (Chao Tan; Yaoyuan Xu; Feng Dong)
Abstract	Determining the boundary of inclusions within an opaque vessel sometimes is of more interest to academic research and industrial application than conductivity distribution when applying Process tomography. This work focuses on reconstructing the boundary of completely conductive inclusions by Boundary Element Method with Electrical resistance tomography (ERT). The integral equations of forward problem are reformed since they are not identical as those for low conductivity. Inverse problem is solved with Levenberg-Marquardt (L-M) Algorithm. The results are verified with numerical simulations and errors have shown acceptable.
Starting Page	45
Ending Page	49
File Size	825400
Page Count	5
File Format	PDF
ISBN	9781612848945
e-ISBN	9781612848969
DOI	10.1109/IST.2011.5962173
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-05-17
Publisher Place	Malaysia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Conductivity Tomography Electrodes Integral equations Contact resistance Mathematical model Jacobian matrices completely conductive inclusions boundary reconstruction electrical resistmography boundary element method Levenberg-Marquardt
Content Type	Text
Resource Type	Article

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