NDLI: Measurement of thickness of molecularly thin lubricant film by using ellipsometric microscopy

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Asia-Pacific Magnetic Recording Conference 2004. Digest of APMRC 2004 (IEEE Cat. No. 04EX942)

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Digest of the Asia-Pacific Magnetic Recording Conference

2000 Asia-Pacific Magnetic Recording Conference. Digests of APMRC2000 on Mechanical and Manufacturing Aspects of HDD (Cat. No.00EX395)

Measurement of thickness of molecularly thin lubricant film by using ellipsometric microscopy

Content Provider	IEEE Xplore Digital Library
Author	Fukuzawa, K. Shimuta, T. Nakada, A. Zhang, H. Mitsuya, Y.
Copyright Year	2004
Description	Author affiliation: Nagoya Univ., Japan (Fukuzawa, K.; Shimuta, T.; Nakada, A.; Zhang, H.; Mitsuya, Y.)
Abstract	Controlling the kinetic behaviors of molecularly thin lubricant is a key technology for designing head-disk interfaces (HDIs) of hard disk drives (HDDs). Direct visualization of molecularly thin lubricant films is useful in investigating kinetic properties such as replenishment or retention of thin lubricant films. To meet this demand, we demonstrated that the ellipsometric microscope can provide real-time visualization with a sub-nm thickness resolution. In this paper, we present a method of measuring the thickness of the lubricant film. In this method, the phase difference between the lights reflected from the film-covered and uncovered regions of the disk is obtained from the polarizer angles; then the thickness is calculated from the phase difference. We verified the feasibility of the method theoretically and experimentally. Measurement error of less than 0.2 nm was experimentally achieved for molecularly thin lubricants. This method provides real-time and quantitative imaging of molecularly thin lubricants and can provide useful information for designing HDIs for high-density HDDs.
File Size	261757
File Format	PDF
ISBN	0780387171
DOI	10.1109/APMRC.2004.1521932
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-08-16
Publisher Place	South Korea
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Thickness measurement Lubricants Microscopy Optical films Kinetic theory Optical imaging Magnetic films Visualization Calibration Polarization
Content Type	Text
Resource Type	Article

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