NDLI: Disk roughness and contact induced FH vibration at sub-10nm FH

Content Provider	IEEE Xplore Digital Library
Author	Rui Xian Zhi-Min Yuan Bo Liu Tow Chong Chong
Copyright Year	2002
Description	Author affiliation: Data Storage Inst., Singapore (Rui Xian; Zhi-Min Yuan; Bo Liu; Tow Chong Chong)
Abstract	As flying height is reduced to the sub-10nm range, intermittent slider-disk contacts occur to modulate the head-disk spacing and thus deteriorate the performance of the magnetic recording system. Therefore, the contact induced flying height vibration has to been monitored and reduced in order to maintain a reliable head disk interface in the proximity recording regime. This paper reports and attempts to explain the relationship between the disk roughness and such induced vibrations by studying the flying height signal on the in-situ flying height tester. Sliders with 6-7 nm FH are used to test the head disk contact on the disks with different roughness. The head-disk contacts on the smoother disk tend to lengthen in duration compared with those on the rough disk. The rough disk shows the clear concentrated vibration modes, whilst the vibration contents of the smooth disk are more evenly distributed across the wide spectrum. The observation from the flying height signal also shows that the bouncing height on the smooth disk is much higher than that on the rough disk.
Sponsorship	IEEE Singapopre Sect. IEEE Magnetics Soc. ASME
File Size	159272
File Format	PDF
ISBN	0780375092
DOI	10.1109/APMRC.2002.1037660
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-08-27
Publisher Place	Singapore
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Vibrations Magnetic recording Magnetic heads Magnetic modulators Disk recording Temperature sensors Monitoring Maintenance Hard disks
Content Type	Text
Resource Type	Article

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