NDLI: Considerations for predicting freezeout and exhaustion under a variety of nontrivial conditions

Content Provider	IEEE Xplore Digital Library
Author	Pieper, R. Michael, S.
Copyright Year	2001
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Naval Postgraduate Sch., Monterey, CA, USA (Pieper, R.)
Abstract	A numerically robust method for evaluating the temperature dependent carrier concentrations and related Fermi levels is considered. The method is applicable to simple cases for which analytic solutions are available as well as more complex cases in which numerical methods are required due to nonstandard effects including bandgap widening, compensation and degeneracy induced by high levels of doping. Known tests do not focus on the use of the algorithm under conditions of high-level doping. A degeneracy correction factor was defined as the essential ingredient in the algorithm that gauges the levels of degeneracy. For the trivial case of nondegenerate conditions the degeneracy factor is approximately one. The critical component is the application of the algorithm for degenerate conditions to obtain a functional evaluation of the degeneracy factor in terms of normalized acceptor and donor energy level differences.
Sponsorship	Russ College of Eng. & Technol.
Starting Page	289
Ending Page	292
File Size	226321
Page Count	4
File Format	PDF
ISBN	0780366611
DOI	10.1109/SSST.2001.918533
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-03-20
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Doping Energy states Flowcharts Dynamic range Temperature Charge carrier processes Integral equations Robustness Photonic band gap Testing
Content Type	Text
Resource Type	Article

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Considerations for predicting freezeout and exhaustion under a variety of nontrivial conditions

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