NDLI: Testability properties of acyclic structures and applications to partial scan design

Content Provider	IEEE Xplore Digital Library
Author	Gupta, R. Breuer, M.A.
Copyright Year	1992
Description	Author affiliation: IBM, Hopewell Junction, NY, USA (Gupta, R.)
Abstract	It is well known that acyclic sequential structures are considerably easier to test than cyclic sequential circuits. Hence some partial scan techniques attempt to simplify the test generation problem by ensuring that the portion of the circuit effectively under test is acyclic. In such designs the test time is dominated by the shifting of test patterns into and out of the scan path. The authors present a compacting technique that minimizes the number of distinct test patterns required to detect an arbitrary fault, thus minimizing the amount of data shifted in to detect the fault. The technique results in (1) a minimal compacted test schedule and (2) a condensed combinational test generation model, which can be used to generate and apply tests to the circuit in an efficient manner.
Starting Page	49
Ending Page	54
File Size	688758
Page Count	6
File Format	PDF
ISBN	0780306236
DOI	10.1109/VTEST.1992.232723
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1992-04-07
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Clocks Kernel Sequential analysis Automatic test pattern generation Automatic testing Circuit faults Test pattern generators Contracts Electrical fault detection
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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