NDLI: DEFUSE: a deterministic functional self-test methodology for processors

Content Provider	IEEE Xplore Digital Library
Author	Chen, L. Dey, S.
Copyright Year	2000
Description	Author affiliation: Dept. of Electr. & Comput. Eng., California Univ., San Diego, La Jolla, CA, USA (Chen, L.)
Abstract	At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-test. However, due to their reliance on random patterns, current logic BIST techniques are not able to deal with large designs without adding high test overhead. In this paper, we propose a functional self-test technique that is deterministic in nature. By targeting the structural test need of manageable components with the aid of processor functionality, this technique has the fault coverage advantage of deterministic structural testing and the at-speed advantage of functional testing. Most importantly, by relieving testers from test application, it enables at-speed testing of GHz processors with low speed testers. We have demonstrated our methodology on a simple accumulator-based microprocessor. The results show that with the proposed technique, we are able to apply high-quality at-speed tests with no test overhead.
Starting Page	255
Ending Page	262
File Size	83751
Page Count	8
File Format	PDF
ISBN	0769506135
ISSN	10930167
DOI	10.1109/VTEST.2000.843853
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-04-30
Publisher Place	Canada
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Automatic testing Microprocessors Logic testing Manufacturing Test pattern generators Logic design Electronics industry Semiconductor device testing Test equipment
Content Type	Text
Resource Type	Article

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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