NDLI: Enhancing test effectiveness for analog circuits using synthesized measurements

Content Provider	IEEE Xplore Digital Library
Author	Variyam, P.N. Chatterjee, A.
Copyright Year	1998
Description	Author affiliation: Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA (Variyam, P.N.)
Abstract	The use of alternate tests in addition to specification-based measurements is achieving more recognition in industry due to the higher coverage that they provide. The fault and yield coverages of these tests depend on how the pass/fail test decision is made. In this paper we address the critical issue of accurate test threshold determination for these alternate tests. We propose to post-process the given set of sensitive and linearly independent measurements to synthesize a new set of measurements based on which the pass/fail decision is made. A novel methodology for post processing the measurement results called measurement synthesis is presented. Simulation results show that test effectiveness can be greatly enhanced by measurement synthesis.
Starting Page	132
Ending Page	137
File Size	43181
Page Count	6
File Format	PDF
ISBN	0818684364
ISSN	10930167
DOI	10.1109/VTEST.1998.670860
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1998-04-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Analog circuits Circuit synthesis Circuit faults Circuit optimization Electric variables measurement Frequency domain analysis Impulse testing Pulse circuits CMOS process
Content Type	Text
Resource Type	Article

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