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Generalization of search state equivalence for automatic test pattern generation

Content Provider	IEEE Xplore Digital Library
Author	Xinghao Chen Bushnell, M.L.
Copyright Year	1995
Description	Author affiliation: CAIP Center, Rutgers Univ., Piscataway, NJ, USA (Xinghao Chen)
Abstract	We present a generalization of the equivalent search state (EST) approach for test generation. A search state represents the current search status based on prior search decisions. The generalized EST identifies 56% more previously-searched decision spaces than its predecessor on the 1985 ISCAS benchmarks. We present the enabling theorem with a proof, results and an example for sequential circuit test generation.
Starting Page	99
Ending Page	103
File Size	515752
Page Count	5
File Format	PDF
ISBN	0818669055
ISSN	10639667
DOI	10.1109/ICVD.1995.512085
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-01-04
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Automatic test pattern generation Circuit testing Automatic testing Sequential circuits Acceleration Test pattern generators Benchmark testing Sequential analysis Built-in self-test Redundancy
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

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