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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Yung-Hui Chung Jieh-Tsorng Wu |
| Copyright Year | 2011 |
| Description | Author affiliation: Department of Electronics Engineering, National Chiao-Tung University, Hsin-Chu, Taiwan (Yung-Hui Chung; Jieh-Tsorng Wu) |
| Abstract | An 8-bit subranging ADC was fabricated using a 55nm CMOS technology. To enhance speed, subranging is executed by activating comparators in the digital domain. To save power, comparators are latches with automatic offset calibration. Operating at 1GHz sampling rate, the ADC consumes 16mW from a 1.2V supply. The measured DNL is 0.8LSB and INL is 1.2LSB. The measured SFDR and SNDR are 55dB and 43.5dB respectively. The ADC occupies an active area of $0.2mm^{2}.$ Its FOM is 125fJ/conversion-step. |
| Starting Page | 128 |
| Ending Page | 129 |
| File Size | 933633 |
| Page Count | 2 |
| File Format | |
| ISBN | 9781612841755 |
| ISSN | 21585636 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-06-15 |
| Publisher Place | Japan |
| Access Restriction | Subscribed |
| Rights Holder | JSAP (Japan Society of Applied Physi |
| Subject Keyword | Latches Calibration Semiconductor device measurement Very large scale integration CMOS technology Capacitors CMOS integrated circuits calibration Analog-digital conversion subranging ADC comparators (circuits) |
| Content Type | Text |
| Resource Type | Article |
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