NDLI: Test procedures and performance assessment of mobile fading channel simulators

Content Provider	IEEE Xplore Digital Library
Author	Patzold, M. Dongwoo Kim
Copyright Year	2004
Description	Author affiliation: Mobile Commun. Group, Agder Univ. Coll., Grimstad, Norway (Patzold, M.)
Abstract	This paper is devoted to the test and the performance assessment of both hardware- and software-implemented simulation models for mobile fading channels. Test procedures are proposed for narrowband as well as for wideband simulators. In the case of narrowband fading, the simulation model's level-crossing rate (LCR) is identified as a proper performance criteria. This quantity gives insight into the distribution of the emulated signal envelope as well as its rate of change. It is shown how the LCR can be measured efficiently and precisely, especially when the signal envelope level is low. It is also shown how this concept can be extended to assess the performance of wideband fading channel simulators based on the tapped-delay-line structure. In this case, the overall LCR and the power delay profile (PDP) are proper quantities which are proposed for the performance assessment. To determine these quantities from the emulated fading signal, various operation modes of the channel simulator are introduced. Several examples illustrate the usefulness of the proposed procedures. They also give insight into the precision of state of the art channel simulators.
Starting Page	254
Ending Page	260
File Size	532892
Page Count	7
File Format	PDF
ISBN	0780382552
ISSN	15502252
DOI	10.1109/VETECS.2004.1387953
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-05-17
Publisher Place	Italy
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fading Software testing Context modeling Wideband Hardware Educational institutions Mobile communication Narrowband Delay System testing
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering Computer Science Applications

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