NDLI: A Model for Low-Voltage Instability in Ceramic Capacitors

Content Provider	IEEE Xplore Digital Library
Author	Loh, Eugene
Copyright Year	1982
Description	Author affiliation: 30746 Principio Drive, Malibu, CA 90265; Electro-Optical Engineering Division. Technology Support Division, Hughes Aircraft Company, Culver City, CA 90230 (Loh, Eugene)
Abstract	Problems of low-voltage instability in ceramic capacitors have recently aroused much interest. Holladay, et al., have measured the time course of DC leakage current of multilayer hermetically sealed ceramic capacitors (K=5500) at room temperature with constant low-voltage bias v, e.g., 1.5V and 3.2V or an average applied field Ea ¿ 0.45 to 1 KV/cm. Their data will be described by a straight line in each of two semilogarithmic graphs, one "In tp versus v¿" and the other "ln ip versus v¿". Here tp, is the time, whence the current reaches a peak ip. From these graphs, a Poole-Frenkel field EPF ¿ 300 Ea, Schottky-like field Es ¿ 7800 Ea, shelf life = 2.7 year and zero bias ip ¿ 15 pA will be deduced. Based on the above parameters, the low-voltage behavior of ceramic capacitors may be interpreted as domain switching in the ferroelectric grain initiated by a Poole-Frankel process in the grain adjacent to the grain boundary. The process is then followed by a Schottky-like emission from the grain surface in order to release screening electrons from pre-switched domain. The conducting path of the DC leakage current from a domain-switching grain is likely along a multitude of intergranular boundaries, instead of passing through the ceramic grains. This concept of grain-boundary conduction is consistent with the general behavior of low-voltage instability of ceramic capacitors. e.g., occasional occurrence and recoverability at high voltages. Low-voltage instabilities may be classified into two types: "intrinsic" type due to manufactur, ed ceramic structure, e.g.
Starting Page	144
Ending Page	151
File Size	8172091
Page Count	8
File Format	PDF
ISSN	07350791
DOI	10.1109/IRPS.1982.363035
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1982-03-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Ceramics Capacitors Leakage current Current measurement Time measurement Nonhomogeneous media Hermetic seals Temperature Ferroelectric materials Grain boundaries
Content Type	Text
Resource Type	Article

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