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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Xu, D. Zhao, W. |
| Copyright Year | 2005 |
| Description | Author affiliation: American Express, Phoenix, AZ, USA (Xu, D.) |
| Abstract | This paper presents a general degradation modeling and analysis approach involving multiple degradation measures. We first explore the correlation between the degradation measure and the failure event by introducing a probabilistic measure. A logistic function is used to define this probabilistic measure and assess the likelihood of a failure event given the degradation level. When the stochastic stress condition is considered this probabilistic measure is an approximation of the likelihood of a failure event. We then propose a state-space model to describe the evolution of the degradation process by incorporating both the degradation dynamics and random stress effects. Finally the degradation dynamics is used to predict the reliability function. The practical use of the proposed method is demonstrated by a case study. |
| Starting Page | 337 |
| Ending Page | 341 |
| File Size | 593510 |
| Page Count | 5 |
| File Format | |
| ISBN | 0780388240 |
| ISSN | 0149144X |
| DOI | 10.1109/RAMS.2005.1408385 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-01-24 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Degradation Logistics Predictive models Acceleration Stochastic processes Stress measurement Data analysis Failure analysis Testing Materials science and technology |
| Content Type | Text |
| Resource Type | Article |
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