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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Castellazzi, A. Johnson, M. Piton, M. Mermet-Guyennet, M. |
| Copyright Year | 2009 |
| Description | Author affiliation: ALSTOM Transportation - Power Electronics Associated Research Laboratory, Séméac, 65600, France (Piton, M.; Mermet-Guyennet, M.) || University of Nottingham, Department of Electrical & Electronic Engineering, NG7 2RD, UK (Castellazzi, A.; Johnson, M.) |
| Abstract | Considering the case of railway-traction applications, this paper proposes an extensive experimental characterization of multi-chip IGBT-modules, combining fast-transient short-circuit electrical measurements with infrared thermal mapping under realistic operation-like working-conditions. Then, it presents the development of a comprehensive electro-thermal compact model of the multi-chip assembly, which accounts for all major functional and structural electro-thermal effects and which can be used in common circuit simulation environments with great flexibility. A selection of simulation examples demonstrates the usefulness of the model in extending and complementing the information that can be gained by experiment. The results provide precious information for a reliable application of these components. |
| Starting Page | 285 |
| Ending Page | 290 |
| File Size | 571679 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424435562 |
| DOI | 10.1109/IPEMC.2009.5157400 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-05-17 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Insulated gate bipolar transistors Voltage Pulse width modulation Circuit testing Rail transportation Power system reliability Temperature Thermal stresses Circuit simulation DC motors |
| Content Type | Text |
| Resource Type | Article |
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