NDLI: Analysis of Diagonal Anisotropic Electrooptic Rectangular Waveguide as an Isotropic Waveguide

Content Provider	IEEE Xplore Digital Library
Author	Zaghloul, A.
Copyright Year	2007
Description	Author affiliation: Zagazig Univ., Zagazig (Zaghloul, A.)
Abstract	A simple and accurate method for analysis of the anisotropic rectangular waveguides is presented. In this analysis the anisotropic waveguide are treated as isotropic waveguide by using the modified of both core refractive index and either waveguide thickness (with $E^{y}$ $_{pq})$ or waveguide width (with $E^{x}$ $_{pq}).$ The anisotropic waveguide and its modified isotropic waveguide are analyzed by using first perturbation method (FPM). Also, modified waveguide is analyzed by effective index method (EIM). This study gives a simple calculation of the propagation constant and the field distribution. The effect of Z, Y and X-cuts of the electrooptic crystal are done. The accuracy by this study increases with the value of ratio $n_{y}/n_{x}$ (with $E^{y}$ $_{pq})$ or $n_{x}/n_{y}$ (with $E^{x}$ $_{pq})$ closes to one. This study is checked with important nine electrooptic materials. The numerical results with X, Y and Z-cuts of nine electrooptic materials are presented as design curves. This analysis is in very good agreement if it is compared and the finite element technique.
Starting Page	1
Ending Page	11
File Size	577252
Page Count	11
File Format	PDF
ISBN	9775031869
DOI	10.1109/NRSC.2007.371405
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-03-13
Publisher Place	Egypt
Access Restriction	Subscribed
Rights Holder	Adademy of Science, Egypt
Subject Keyword	Electrooptical waveguides Rectangular waveguides Anisotropic magnetoresistance Optical waveguides Crystalline materials Optical materials Refractive index Propagation constant Dielectric materials Perturbation methods
Content Type	Text
Resource Type	Article

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