NDLI: Total dose radiation testing of the Intel 80386DX microprocessor and 80387DX math coprocessor using a personal computer motherboard for the test fixture

Content Provider	IEEE Xplore Digital Library
Author	Mulford, S.G.
Copyright Year	1994
Description	Author affiliation: Equipment Div., Raytheon Co., Sudbury, MA, USA (Mulford, S.G.)
Abstract	Total dose small sample evaluation (SSE) testing of the Intel 80386DX 32 bit microprocessor and 80387DX 32 bit math coprocessor has been performed using an AT IBM based personal computer. A quantity of three 80386DX devices and five 80387DX devices were used for the test. All testing was performed with the AT motherboard as the test fixture. The dose rates achieved for the tests were 0.3 krads (Si)/min for the 80368DX and 0.4 krads (Si)/min for the 80387DX. The test temperature was 25 degrees Celsius and the clock frequency was 40 MHz for the 80386DX and 30 MHz for the 80387DX. The critical parameter monitored for these devices was functionality. The mean failure level for the 80386DX devices was found to be 11.4 krads (Si). The mean failure level for the 80387DX devices was found to be 13.7 krads (Si).
Starting Page	26
Ending Page	29
File Size	318377
Page Count	4
File Format	PDF
ISBN	0780320220
DOI	10.1109/REDW.1994.633032
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-07-20
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Microprocessors Coprocessors Microcomputers Fixtures Performance evaluation Temperature Clocks Frequency Condition monitoring
Content Type	Text
Resource Type	Article

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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