NDLI: An Approach for Fault Localization Based on Program Slicing and Bayesian

Content Provider	IEEE Xplore Digital Library
Author	Yingqi Liu Wei Li Shujuan Jiang Yanmei Zhang Xiaolin Ju
Copyright Year	2013
Description	Author affiliation: Sch. of Comput. Sci. & Technol., China Univ. of Min. & Technol., Xuzhou, China (Yingqi Liu; Wei Li; Shujuan Jiang; Yanmei Zhang; Xiaolin Ju)
Abstract	The key issue of reducing software cost and improving software reliability is locating defective codes precisely and efficiently. In this paper, we propose a fault localization method which combines program slicing and Bayesian method. First, we perform dynamic program slicing according to the slicing criteria. Then, we calculate the posterior probability according to Bayesian Theory. Finally, we take the posterior probability as the suspicion degree of the statement and rank the statements in the descending order based on suspicion degree. We apply our approach to six open-source programs. The results of the experiments show that the method we propose can improve the precision of fault localization to some extent.
Sponsorship	IEEE Reliab. Soc.
Starting Page	326
Ending Page	332
File Size	305713
Page Count	7
File Format	PDF
ISBN	9780769550398
DOI	10.1109/QSIC.2013.29
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-07-29
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Bayes methods Software Debugging Algorithm design and analysis Computer bugs Personnel Bayesian program slicing fault localization
Content Type	Text
Resource Type	Article

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