NDLI: Interconnect mode conversion in high-speed VLSI circuits

Content Provider	IEEE Xplore Digital Library
Author	Quere, Y. LeGouguec, T. Martin, P.M. Huret, F.
Copyright Year	2004
Description	Author affiliation: Lab. d'Electronique et Systemes de Telecommun., Univ. de Bretagne Occidentale, Brest, France (Quere, Y.; LeGouguec, T.; Martin, P.M.; Huret, F.)
Abstract	A modification of the electromagnetic field configuration (mode conversion) at interconnect discontinuities in deep submicron digital ULSI circuits was investigated by using a full wave electromagnetic analysis. The mode conversion analysis is indispensable in identifying the signal return path, the return current distribution, and therefore for an accurate inductance modeling which remains a challenging problem. On the other hand, switching activity of a high speed CMOS circuit may produce large current derivatives. These transient currents can generate large potential surges and coupled noise due to the parasitic resistances and inductances of the wires. To this aim, we determined a simple design rule to reduce the mode conversion phenomenon and, therefore, decrease noise in high-speed ULSI circuits.
Sponsorship	IEEE Electron Devices Soc. IEEE Componants, Packaging and Manufacturing Technol. Soc.
Starting Page	265
Ending Page	270
File Size	357116
Page Count	6
File Format	PDF
ISBN	0769520936
DOI	10.1109/ISQED.2004.1283684
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-03-22
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Integrated circuit interconnections Very large scale integration Ultra large scale integration Circuit noise Electromagnetic fields Electromagnetic analysis Signal analysis Signal processing Current distribution Inductance
Content Type	Text
Resource Type	Article

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