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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Rovang, D. Van De Valde, D. Gregerson, D. Puetz, E. Bruner, N. Cooper, G. Cordova, S. Droemer, D. Hahn, K. Johnston, M.D. Maenchen, J. McLean, J. Molina, I. Oliver, B. O'Malley, J. Portillo, S. Welch, D. |
| Copyright Year | 2006 |
| Description | Author affiliation: Sandia Nat. Labs., Albuquerque, NM (Rovang, D.) |
| Abstract | Sandia National Laboratories is investigating and developing high-dose, high-brightness flash radiographic sources. The $immersed-B_{z}$ diode employs large-bore, high-field solenoid magnets to help guide and confine an intense electron beam from a needle-like cathode "immersed" in the axial field of the magnet. The electron beam is focused onto a high-atomic-number target/anode to generate an intense source of bremsstrahlung X-rays. Historically, these diodes have been unable to achieve high dose (> 500 rad @ m) from a small spot (< 3 mm diameter). It is believed that this limitation is due in part to undesirable effects associated with the interaction of the electron beam with plasmas formed at either the anode or the cathode. Previous research concentrated on characterizing the behavior of diodes, which used untreated, room temperature (RT) anodes. Research is now focused on improving the diode performance by modifying the diode behavior by using cryogenic anodes that are coated in-situ with frozen gases. The objective of these cryogenically treated anodes is to control and limit the ion species of the anode plasma formed and hence the species of the counter-streaming ions that can interact with the electron beam. Recent progress in the development, testing and fielding of the cryogenically cooled immersed diodes at Sandia is described. |
| Starting Page | 797 |
| Ending Page | 800 |
| File Size | 2674861 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780391896 |
| DOI | 10.1109/PPC.2005.300781 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2005-06-13 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Testing Diodes Cryogenics Anodes Electron beams Plasma temperature Magnets Cathodes Laboratories Radiography |
| Content Type | Text |
| Resource Type | Article |
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