NDLI: Reliability analysis of a modern power supply under nuclear radiation effects

Content Provider	IEEE Xplore Digital Library
Author	Kulkarni, R.D. Agarwal, V.
Copyright Year	2003
Description	Author affiliation: Dept. of Electr. Eng., Indian Inst. of Technol., Mumbai, India (Kulkarni, R.D.; Agarwal, V.)
Abstract	The nuclear radiation damage due to displacement and ionization effects on power devices is well known. This affects the performance of the systems, which use these power devices. This paper presents a study on the performance degradation of a modern power supply unit operating in a nuclear environment. In this paper, a buck-boost converter has been considered which is used for feeding DC power to various electronic systems, DC drives, etc. in nuclear power plant. The power devices, which constitute the buck-boost converter, were irradiated with gamma rays and the basic parameters were monitored to determine the deviations. The experimental results have been utilized to find out the probability of failure of each device of the power converter and subsequently the reliability evaluation of the buck-boost converter has been carried out using fault tree analysis. The experimental database has been used to mathematically model the gamma radiation effects, which helps in predicting the life of electronic systems in a nuclear environment. The polynomials derived are very useful for enhancing the availability of modern power supply system working in a nuclear environment. The buck-boost converter has been simulated using PSpice to analyse the overall effect of gamma radiation damage on the modern power supply system by feeding experimental results of individual power devices into the simulation. Detail experimental and analysis results are presented.
Starting Page	71
Ending Page	76
File Size	607100
Page Count	6
File Format	PDF
ISBN	0780378857
DOI	10.1109/PEDS.2003.1282681
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2003-11-17
Publisher Place	Singapore
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Power supplies Radiation effects Gamma rays Power system reliability Analytical models Ionizing radiation Ionization Degradation Power generation Condition monitoring
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Issues related to nuclear radiation effects on semiconductor devices

Wavelet analysis based condition monitoring of fuelling machine grab cables

Reliability Model of Distribution Network with Distributed Generation

A Microprocessor Based Environmental Radiation Monitoring System

Application of Device Simulations to Radiation Hardening Studies

Development of a Portable Gamma Radiation Monitoring System

Development of a calculating system using power supply reliability field data in Japan

Neutron induced oxide degradation in MOSFET structures

A Microcomputer-Based Radiation Monitoring System for Nuclear Power Plants

Reliability analysis of a modern power supply under nuclear radiation effects

Similar Documents

Issues related to nuclear radiation effects on semiconductor devices

Wavelet analysis based condition monitoring of fuelling machine grab cables

Reliability Model of Distribution Network with Distributed Generation

A Microprocessor Based Environmental Radiation Monitoring System

Application of Device Simulations to Radiation Hardening Studies

Development of a Portable Gamma Radiation Monitoring System

Development of a calculating system using power supply reliability field data in Japan

Neutron induced oxide degradation in MOSFET structures

A Microcomputer-Based Radiation Monitoring System for Nuclear Power Plants

Reliability analysis of a modern power supply under nuclear radiation effects