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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Paduraru, C. |
| Copyright Year | 2004 |
| Description | Author affiliation: MEGGER, Dallas, TX, USA (Paduraru, C.) |
| Abstract | The paper describes different techniques in testing the characteristics of modern microprocessor impedance relays and their influence over developing a valid test plan. First, a brief description of historical development of distance relays is described. Then, the need for automated testing of the relays is explained. A practical application in testing phase-to-ground faults characteristics is presented. First the concept of loop impedance calculation is described. Challenges experienced and solutions provided for automatic testing of the impedance relays are shown. The paper emphasizes the importance of correct selection of the zero sequence compensation factors and shows the impact over relay operation. Finally the results are summarized and conclusions are drawn. |
| Starting Page | 87 |
| Ending Page | 90 |
| File Size | 532581 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780386108 |
| DOI | 10.1109/ICPST.2004.1459971 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-11-21 |
| Publisher Place | Singapore |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Protective relaying Impedance Automatic testing Relays Power system simulation Power system relaying Modems Microprocessors Protection Manufacturing |
| Content Type | Text |
| Resource Type | Article |
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