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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Shu Hongchun Si Dajun Ge Yaozhong Chen Xunyun |
| Copyright Year | 2002 |
| Description | Author affiliation: Kunming Univ. of Sci. & Technol., China (Shu Hongchun) |
| Abstract | The arcing fault has a high probability of occurence on a HV transmission line. To date, the transient resistance is always assumed as a linear constant resistance in most of the locating algorithms. On the basis of the previous achievements in arc modeling, the paper describes an ideal voltage-current transform characteristic relationship and its equivalent circuit representing for long arc, and then presents a novel short time-window method for locating arcing faults on coupled double-circuit HV transmission line using one-terminal voltage and current samples. The method proposed has the advantages as follows: (1) arcing discharge is taken into account; (2) CT saturation is considered for a short time-window, which can be chosen from the initial time of a fault, less than half period; and (3) far-terminal equivalent impedance is not required. Moreover, the requirement of high accuracy to fault location is ensured by using the least error squares method. A lot of digital simulation shows that the scheme is feasible. The method has been applied to Kunming electric network. |
| Sponsorship | IEEE Power Eng. Soc. (IEEE PES) Chinese Soc. Electr. Eng. (CSEE) China Electric Power Res. Inst. IEEE/PES Beijing Chapter |
| Starting Page | 2101 |
| Ending Page | 2105 |
| File Size | 267912 |
| Page Count | 5 |
| File Format | |
| ISBN | 0780374592 |
| DOI | 10.1109/ICPST.2002.1047152 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-10-13 |
| Publisher Place | China |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Transmission lines Circuit faults Distributed parameter circuits Voltage Fault location Power system transients Equivalent circuits Coupling circuits Fault currents Impedance |
| Content Type | Text |
| Resource Type | Article |
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