NDLI: Predicting capacitor reliability in a module-integrated photovoltaic inverter using stress factors from an environmental usage model

Content Provider	IEEE Xplore Digital Library
Author	Castillo, S.J. Balog, R.S. Enjeti, P.
Copyright Year	2010
Description	Author affiliation: Department of Electrical Engineering, Texas A&M University, College Station, USA (Castillo, S.J.; Balog, R.S.; Enjeti, P.)
Abstract	In order for photovoltaic energy to achieve grid parity, the levelized cost of energy (the total lifetime cost) must be reduced. This is not possible by addressing only the solar cells since the inverter is a critical weak link in the system. It is well known that aluminum electrolytic capacitors, ubiquitous in power electronic converters, have end-of-life and failure modes that are sensitive to environmental conditions including temperature. In an ACPV system the inverter is mounted on the photovoltaic (PV) module which exposes the capacitors to potentially elevated temperatures which can increase their failure rate. Existing techniques of derating the capacitors increase the cost of the inverter, so they must be applied judiciously. This paper presents a technique to more accurately compute the MTBF of the capacitors used in a PV inverter by utilizing a thermal model of the PV module to predict operating temperature.
Starting Page	1
Ending Page	6
File Size	1334981
Page Count	6
File Format	PDF
ISBN	9781424480463
e-ISBN	9781424480470
DOI	10.1109/NAPS.2010.5618955
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2010-09-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Copper Warranties Temperature sensors Capacitors Inverters
Content Type	Text
Resource Type	Article

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