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Content Provider | IEEE Xplore Digital Library |
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Author | Shen, Z.J. Robb, S.P. |
Copyright Year | 1996 |
Description | Author affiliation: Power Products Div., Motorola Inc., Phoenix, AZ, USA (Shen, Z.J.; Robb, S.P.) |
Abstract | In this paper, we have developed a new smart discrete technology to monolithically integrate the high voltage vertical IGBT with low-voltage NMOS protection circuitry by adding a p-well step to the conventional IGBT process. Two new 600 V intelligent IGBTs, based on the same technology but using different protection schemes, are reported for the first time. The first intelligent IGBT provides protection against over-current and over-temperature conditions. The second intelligent IGBT provides protection against short circuit conditions by means of sensing collector voltage. The typically observed characteristics of the intelligent IGBT's include a forward voltage of 1.4 V at a current density of 100 A/cm/sup 2/, a turn-off fall time of 200 ns, and a short-circuit withstand time at 125/spl deg/C of more than 50 /spl mu/s. |
Starting Page | 295 |
Ending Page | 298 |
File Size | 416938 |
Page Count | 4 |
File Format | |
ISBN | 0780331060 |
ISSN | 10636854 |
DOI | 10.1109/ISPSD.1996.509501 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1996-05-23 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Monolithic integrated circuits Insulated gate bipolar transistors MOSFETs Resistors Protection Diodes Temperature sensors Threshold voltage Fault detection Silicon |
Content Type | Text |
Resource Type | Article |
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