NDLI: An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology

Content Provider	IEEE Xplore Digital Library
Author	Igarashi, M. Takeuchi, K. Okagaki, T. Shibutani, K. Matsushita, H. Nii, K.
Copyright Year	2015
Description	Author affiliation: Renesas Electron. Corp., Tokyo, Japan (Igarashi, M.; Takeuchi, K.; Okagaki, T.; Shibutani, K.; Matsushita, H.; Nii, K.)
Abstract	We propose an on-die aging monitor based on ring-oscillator (RO) which measures bias-temperature-instabilities (BTI) and AC hot-carrier-infection (HCI). The monitor consists of a symmetric RO (SRO) and an asymmetric RO (ASRO). The effect of NBTI and PBTI can be separated by focusing on the difference in sensitivity observed in SRO and ASRO under DC stress condition. In addition, the speed degradation caused by AC-HCI is monitored because unbalanced delay with long/short transition in ASRO has high sensitivity against AC-HCI under AC stress. A test chip including both SRO and ASRO using 2NAND standard cells is implemented in a 16 nm Fin-FET bulk CMOS technology. We observe that Vth shift due to PBTI measured from frequency degradation is 2 mV, which is still 1/10 of NBTI in Fin-FET technology. The measured AC-HCI shows almost half percentage of all aging factors. The aging monitor optimizes the design guard band (GB) in design phase and enables dependable system in high performance application LSIs.
Starting Page	112
Ending Page	115
File Size	842258
Page Count	4
File Format	PDF
ISBN	9781467374705
ISSN	19308833
e-ISBN	9781467374729
DOI	10.1109/ESSCIRC.2015.7313841
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-09-14
Publisher Place	Austria
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Monitoring Aging Degradation Stress Human computer interaction Semiconductor device measurement Stress measurement DVFS 16 nm Fin-FET NBTI PBTI HCI Symmetric Asymmetric Ring Oscillator
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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