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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Cornet, N. Guerret-Piecourt, C. Fitting, H.-J. Goeuriot, D. Touzin, M. Juve, D. |
| Copyright Year | 2007 |
| Description | Author affiliation: Laboratoire de Tribologie et Dynamique des Systèmes UMR CNRS 5513, Ecole Centrale de Lyon, 36 avenue Guy de Collongue, F-69134 Ecully cedex, France (Juve, D.) || Centre Sciences des Matériaux et des Structures, Ecole Nationale Supérieure des Mines de Saint-Etienne, UMR CNRS 5146, 158 cours Fauriel, F - 42023 Saint-Etienne cedex 2, France (Cornet, N.; Goeuriot, D.; Touzin, M.) || Physics Department, University of Rostock, Universitätsplatz 3, D - 18051 Rostock, Germany (Fitting, H.-J.) || Laboratoire de Tribologie et Dynamique des Systèmes UMR CNRS 5513, Ecole Centrale de Lyon, 36 avenue Guy de Collongue, F-69134 Ecully cedex, France. E-mail: christelle.guerret@ec-lyon.fr (Guerret-Piecourt, C.) |
| Abstract | This work is focused on the charging behavior of bulk dielectric sample covered with a surface layer. Indeed, thanks to a flight-drift model of electrons and holes in insulators and an iterative computer simulation, it is possible to understand the charge transport and trapping in bulk insulating samples. However the presence of a surface layer modifies the electrical charging of the whole sample, as previously experimentally shown by other teams. The aim of the present work is to show by simulation and experimental measurements, the influence of an overlayer on the electron and hole injection, drift and trapping, on the secondary electron emission and on the spatial charging of overlayered dielectrics. A special effective layer method is introduced in the model to describe the electron scattering and straggling in the layered sample. The surface leakage currents on the top surface are also taken into account, as well as the effects of the temperature on the trapping-detrapping processes by a Poole-Frenkel like approach. The numerical and experimental results will be presented in the case of a bulk alumina which surface has been modified by femtosecond laser irradiation. |
| Starting Page | 27 |
| Ending Page | 30 |
| File Size | 2614304 |
| Page Count | 4 |
| File Format | |
| ISBN | 1424407508 |
| DOI | 10.1109/ICSD.2007.4290744 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-07-08 |
| Publisher Place | UK |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Electron traps Surface charging Dielectrics and electrical insulation Charge carrier processes Electron emission Computer simulation Computational modeling Dielectric measurements Scattering Leakage current |
| Content Type | Text |
| Resource Type | Article |
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