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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Tanaka, Y. Usui, Y. Umemura, K. Takada, T. Watanabe, R. Tomita, N. |
| Copyright Year | 2004 |
| Description | Author affiliation: Musashi Inst. of Technol., Tokyo, Japan (Tanaka, Y.; Usui, Y.; Umemura, K.; Takada, T.; Watanabe, R.; Tomita, N.) |
| Abstract | Surface and bulk charge distribution on and in dielectric materials is measured using optical methods. In space environment, a spacecraft is exposed by high-energy cosmic rays. The electric potential of insulating materials on the surface of the spacecraft charged up when the cosmic rays are irradiated to the spacecraft. Sometimes, the change of the electric potential causes an unexpected accident of electrostatic discharge (ESD) with serious damage to the electric devices. To understand the mechanism of the ESD, the measurement of charge distribution on surface of the dielectric materials and/or bulk charge distribution in dielectric materials should be carried out. Therefore, we have proposed to use an optical method using Pockels and Kerr effects for the measurement of surface and bulk charge distributions, respectively. Using these methods, we have already succeeded in measuring the surface charge distribution on Kapton/spl reg/ and measuring the bulk charge distribution in PMMA irradiated by electron beam. In this paper, a summary for the optical measurement results is introduced following the brief explanation of the measurement principles. |
| Sponsorship | IEEE Dielectrics and Elec. Insulation Soc |
| Starting Page | 959 |
| Ending Page | 962 |
| File Size | 324753 |
| Page Count | 4 |
| File Format | |
| ISBN | 0780383486 |
| DOI | 10.1109/ICSD.2004.1350591 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2004-07-05 |
| Publisher Place | France |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Measurement techniques Current measurement Dielectric measurements Charge measurement Nonlinear optics Dielectric materials Aircraft manufacture Electrostatic discharge Electrostatic measurements Cosmic rays |
| Content Type | Text |
| Resource Type | Article |
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