NDLI: Classifying faulty modules with an extension of the H-index

Content Provider	IEEE Xplore Digital Library
Author	Morasca, S.
Copyright Year	2015
Description	Author affiliation: Dipt. di Sci. Teoriche e Applicate, Univ. degli Studi dell'Insubria, Varese, Italy (Morasca, S.)
Abstract	Background. Fault-proneness estimation models provide an estimate of the probability that a software module is faulty. These models can be used to classify modules as faulty or non-faulty, by using a fault-proneness threshold: modules whose fault-proneness exceeds the threshold are classified as faulty and the others as non-faulty. However, the selection of the threshold value is to some extent subjective, and different threshold values may lead to very different results in terms of classification accuracy. Objective. We introduce and empirically validate a new approach to setting thresholds, based on an extension of the H-index defined in Bibliometrics, called the Fault-proneness H-Index. We define and use this extension to identify the most fault-prone modules, which are candidates for intensive Verification & Validation activities. Method. We carried out the empirical validation on two data sets with different faultiness characteristics hosted on the PROMISE repository, by using T-times K-fold cross validation. We computed Precision, Recall, the F - measure, and a weighted version of the F - measure for the results obtained with our approach and compared them with the values obtained with other approaches based on several thresholds. Results. In the empirical validation, our approach provides better classification results than those based on most other thresholds, according to some classification accuracy indicators, in a statistically significant way. Conclusions. Our approach seems to be able to contribute to accurately classifying modules as faulty or non-faulty.
Starting Page	416
Ending Page	426
File Size	156930
Page Count	11
File Format	PDF
e-ISBN	9781509004065
DOI	10.1109/ISSRE.2015.7381835
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-11-02
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software Harmonic analysis Random variables Weight measurement Bibliometrics Indexes Fault diagnosis
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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