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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kaufman, L.M. Dugan, J.B. Johnson, B.W. |
| Copyright Year | 1998 |
| Description | Author affiliation: Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA (Kaufman, L.M.) |
| Abstract | Software reliability models have been successfully applied to many industrial applications, but have the unfortunate drawback of requiring data from which one can formulate a model. The data used for these models frequently comes from pre-release testing and/or field experience, and is of sufficient quantity and quality for most large-scale commercial applications. Software which is developed for safety-critical applications is frequently unable to produce such data, for at least two reasons. First, the software is frequently one-of-a-kind, and second, it rarely fails. Safety-critical software is expected to pass every test, producing precious little failure data. "Statistics of the extremes" is a special branch of statistics developed for analysis of rare events. Where traditional statistical analysis uses the law of large numbers to provide information concerning points which are near the mean of the distribution, statistics of the extremes concentrates on the tails. Analysis of rare event data using statistics of the extremes does not require a-priori assumptions concerning the distributional form of the data, and thus provides an interesting alternative to traditional approaches. In this paper, we develop a software reliability model using statistics of the extremes, which is particularly applicable to safety-critical software systems. |
| Starting Page | 355 |
| Ending Page | 363 |
| File Size | 1855652 |
| Page Count | 9 |
| File Format | |
| ISBN | 0818689919 |
| ISSN | 10719458 |
| DOI | 10.1109/ISSRE.1998.730901 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1998-11-04 |
| Publisher Place | Germany |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Statistical analysis Software reliability Statistical distributions Application software Software safety Computer industry Large-scale systems Software testing Failure analysis Probability distribution |
| Content Type | Text |
| Resource Type | Article |
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