NDLI: Software metrics model for quality control

Content Provider	IEEE Xplore Digital Library
Author	Schneidewind, N.F.
Copyright Year	1997
Description	Author affiliation: Naval Postgraduate Sch., Monterey, CA, USA (Schneidewind, N.F.)
Abstract	A model is developed for validating and applying metrics for quality control, using the Space Shuttle flight software as an example. We validate metrics with respect to a quality factor in accordance with the metrics validation methodology previously developed. Boolean discriminant functions (BDFs) are developed for use in the quality control process. These functions make fewer mistakes in classifying software that is low quality than is the case when linear vectors of metrics are used because the BDFs include additional information for discriminating quality: critical values. Critical values are threshold values of metrics that are used to either accept or reject modules when the modules are inspected during the quality control process. A series of nonparametric statistical methods is used to: 1) identify a set of candidate metrics for further analysis; 2) identify the critical values of the metrics, and 3) find the optimal function of metrics and critical values. A marginal analysis should be performed when making a decision about how many metrics to use in a quality control process. Certain metrics are dominant in their effects on classifying quality and additional metrics are not needed to accurately classify quality. This effect is called dominance. Related to the property of dominance is the property of concordance, which is the degree to which a set of metrics produces the same result in classifying software quality. A high value of concordance implies that additional metrics will not make a significant contribution to accurately classifying quality; hence, these metrics are redundant.
Starting Page	127
Ending Page	136
File Size	887294
Page Count	10
File Format	PDF
ISBN	0818680938
DOI	10.1109/METRIC.1997.637173
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-11-05
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software metrics Quality control Q factor Application software Software quality Space shuttles Vectors Statistical analysis Performance analysis Process control
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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