NDLI: Managing Conflicts When Using Combination Strategies to Test Software

Content Provider	IEEE Xplore Digital Library
Author	Grindal, M. Offutt, J. Mellin, J.
Copyright Year	2007
Description	Author affiliation: Humanities & Informatics, Univ. of Skovde (Grindal, M.)
Abstract	Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each parameter, are potential test cases. In most models, some values of two or more parameters cannot be combined. Testers must then detect and avoid or remove these conflicts. This paper proposes two new methods for automatically handling such conflicts and compares these with two existing methods, based on the sizes of the final conflict-free test suites. A test suite reduction method, usable with three of the four investigated methods is also included in the study, resulting in seven studied conflict handling methods. In the experiment, the number and types of conflicts, as well as the size of the input parameter model and the coverage criterion used, are varied. All in all, 3854 test suites with a total of 929,158 test cases were generated. Two methods stand out as tractable and complementary. The best method (called the avoid methods) with respect to test suite size is to avoid selection of test cases with conflicts. However, this method cannot always be used. The second best method (called the replace method), removing conflicts from the final test suite, is completely general.
Sponsorship	Data Processors Infosys Australia Davies Collison Cave Object Consulting Sun Microsystems Labs Swinburne Univ. Technol. IT Today Elsevier Australia
Starting Page	255
Ending Page	264
File Size	145315
Page Count	10
File Format	PDF
ISBN	0769527787
ISSN	15300803
DOI	10.1109/ASWEC.2007.27
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2007-04-10
Publisher Place	Australia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Software testing System testing Informatics Engineering management Software engineering Automatic testing
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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