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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Tomeo-Reyes, I. Liu-Jimenez, J. Rubio-Polo, I. Fernandez-Saavedra, B. |
| Copyright Year | 2011 |
| Description | Author affiliation: IDTestingLab, Carlos III University of Madrid, Avda. Gregorio Peces Barba, 1. Lab. 1.0.B.08, E-28919 - Leganes (Madrid), Spain (Fernandez-Saavedra, B.) || University Group for Identification Technologies, Carlos III University of Madrid, Avda. Mar Mediterraneo, 22. Office 1.23, E-28918 - Leganes (Madrid), Spain (Tomeo-Reyes, I.; Liu-Jimenez, J.) || Electronic Technology Department Carlos III University of Madrid Avda. Universidad, 30. Office 1.2.F.09 E-28911 - Leganes (Madrid), Spain (Rubio-Polo, I.) |
| Abstract | When working with biometrics, regardless of the modality, it is essential to consider data quality, as it can limit the accuracy of recognition systems. In this context, the assessment of biometric samples quality by defining quality metrics can be used to enhance the performance and functionality of a biometric system. In this work, the influence of ISO/IEC 29794–6 quality metrics on iris recognition systems performance has been analysed. To carry out the analysis, the corresponding metrics have been calculated according to the computational method detailed in the standard and a quality score has been obtained. Then, in order to determine the metrics influence, an open source iris recognition system as well as one publicly available dataset, have been used. Results show to what extent an iris recognition system can be affected by input images quality, and also the most influential quality metrics on recognition accuracy. |
| Starting Page | 1 |
| Ending Page | 7 |
| File Size | 353022 |
| Page Count | 7 |
| File Format | |
| ISBN | 9781457709029 |
| ISSN | 21530742 |
| e-ISBN | 9781457709036 |
| DOI | 10.1109/CCST.2011.6095926 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-10-18 |
| Publisher Place | Spain |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | sample quality Biometrics iris recognition quality metrics |
| Content Type | Text |
| Resource Type | Article |
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