NDLI: Exploiting the selfish gene algorithm for evolving cellular automata

Content Provider	IEEE Xplore Digital Library
Author	Corno, F. Sonza Reorda, M. Squillero, G.
Copyright Year	2000
Description	Author affiliation: Dipt. di Autom. e Inf., Politecnico di Torino, Italy (Corno, F.)
Abstract	This paper shows an application in the field of Electronic CAD of the Selfish Gene algorithm, an evolutionary algorithm based on a recent interpretation of the Darwinian theory. Testing is a key issue in the design and production of digital circuits and the adoption of Built-In Self-Test (BIST) techniques is increasingly popular. In this paper, the Selfish Gene algorithm is adopted for determining the logic for a BIST architecture based on Cellular Automata (CA). A Genetic Algorithm has already been proposed for identifying good BIST architectures based on CA. However, by adopting 2-bit cells, such a method introduced a significant area overhead. Thanks to the adoption of the new and more powerful search engine, we were able to identify simpler BIST structures with a lower area overhead, but still able to obtain the same fault coverage.
Starting Page	577
Ending Page	581
File Size	393110
Page Count	5
File Format	PDF
ISBN	0769506194
ISSN	10987576
DOI	10.1109/IJCNN.2000.859457
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-07-27
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Built-in self-test Circuit testing Design automation Evolutionary computation Automatic testing Production Digital circuits Logic Genetic algorithms Search engines
Content Type	Text
Resource Type	Article

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