NDLI: A Tool To Analyze The Response of EMC Chambers

Content Provider	IEEE Xplore Digital Library
Author	Vielva, Carlos Manuel Basterrechea, Jose
Copyright Year	2000
Description	Author affiliation: Dpto. Ingeniería de Comunicaciones. ETSIIT. Universidad de Cantabria, Avda. Los Castros s/n. 39005. Santander. Cantabria. SPAIN (Vielva, Carlos Manuel) \|\| Dpto. Ingeniería de Comunicaciones. ETSIIT. Universidad de Cantabria, Avda. Los Castros s/n. 39005. Santander. Cantabria. SPAIN. jose@gsr.unican.es (Basterrechea, Jose)
Abstract	A method for the analysis of anechoic and semianechoic chambers in the low frequency range is presented in this work. The method combines homogeneization with geometrical optics to account for multiple reflections in absorber lined chambers. Image theory is used to speed up the computation. The method is able to deal with different kind of absorbers (multilayer, pyramidal, hybrid) with their geometrical dimensions and shape stating the upper frequency limit of validity of the approach. Both dielectric and magnetic lossy materials are considered. The method has been implemented in a software tool with a GUI and allows the user an easy introduction of geometrical data for both the screening and the absorbers.
Starting Page	1
Ending Page	4
File Size	3708685
Page Count	4
File Format	PDF
DOI	10.1109/EUMA.2000.338792
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2000-10-02
Publisher Place	France
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electromagnetic compatibility Frequency Dielectric losses Magnetic materials Geometrical optics Optical reflection Magnetic multilayers Shape Magnetic losses Dielectric materials
Content Type	Text
Resource Type	Article

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