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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Kurogi, S. Sakamoto, H. Nobutomo, H. Fuchikawa, Y. Nishida, T. Mimata, M. Itoh, K. |
| Copyright Year | 2002 |
| Description | Author affiliation: Kyushu Inst. of Technol., Kitakyushu, Japan (Kurogi, S.; Sakamoto, H.; Nobutomo, H.; Fuchikawa, Y.; Nishida, T.) |
| Abstract | The competitive associative net, called CAN2-2, is presented for learning to approximate time-varying dynamics of a plant in order to control the plant. Although the learning method has been shown effective in the previous studies, it uses the gradient method involving local minima problems. To overcome the problems, we here consider an asymptotic situation, where the number of units of the net is very large, and show that the mean square error of the CAN2-2 in approximating time-varying function decreases and is minimized as the number of units increases when the firing numbers of the units are equated. Next, we embed the condition for equating the firing numbers into the learning algorithm of the CAN2-2, and then examine the conventional model switching predictive controller using the modified CAN2-2 in temperature control of the RCA solutions for cleaning silicon wafers which expose the exothermic nonlinear and time-varying chemical reactions. The result confirms that the present method has better learning properties than the conventional one. |
| Sponsorship | Asia-Pacific Neural Network Assembly Singapore Neuroscience Assoc. SEAL & FSKD Conference Steering Committees IEEE Neural Networks Soc. Int. Neural Network Soc. Eur. Neural Network Soc. SPIE |
| Starting Page | 1900 |
| Ending Page | 1904 |
| File Size | 284281 |
| Page Count | 5 |
| File Format | |
| ISBN | 9810475241 |
| DOI | 10.1109/ICONIP.2002.1199004 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2002-11-18 |
| Publisher Place | Singapore |
| Access Restriction | Subscribed |
| Rights Holder | Nanyang Technological University |
| Subject Keyword | Approximation error Temperature control Cleaning Firing Learning systems Gradient methods Mean square error methods Semiconductor device modeling Predictive models Silicon |
| Content Type | Text |
| Resource Type | Article |
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