NDLI: Eigen space based method for detecting faulty nodes in large scale enterprise systems

Content Provider	IEEE Xplore Digital Library
Author	Agarwal, M.K.
Copyright Year	2008
Description	Author affiliation: IBM India Res. Labs., New Delhi (Agarwal, M.K.)
Abstract	In modern enterprise system environment when systemspsila performance degrades, detecting the anomaly is a hard problem. In this replicated environment, there can be hundreds or even thousands of server nodes for a single application. These nodes have implicit as well as explicit interdependencies with each other. Further due to heterogeneous capacities of nodes in the cluster, same fault may produce vastly different effect on the monitored metrics of different nodes. In case of performance problem, finding faulty node(s) in this environment is tedious and time consuming exercise with constantly changing workload, topology and SLA requirements. In this paper we present a novel eigen space based technique to detect anomaly in enterprise environment without any extra monitoring overhead. We monitor certain metrics on each of the node in cluster which are available in enterprise environment. We need a small number of most recent samples of each of these monitored metrics as our only historical information. Our technique adapts well in dynamic conditions, simple to operate and in case of an anomaly, automatically produces a list of faulty node(s). We have implemented this method in a 3-tier cluster environment with total 13 nodes. We have tested our algorithm by introducing faults in front tier, middle tier and backend tier. Our method is always able to separate out faulty nodes with high accuracy and precision.
Starting Page	224
Ending Page	231
File Size	263475
Page Count	8
File Format	PDF
ISBN	9781424420650
ISSN	15421201
DOI	10.1109/NOMS.2008.4575138
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-04-07
Publisher Place	Brazil
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault detection Large-scale systems Topology Condition monitoring Fault diagnosis Degradation Testing Clustering algorithms Art Delay eigen space analysis problem detection system management
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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